[AIP SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation - Daegu (Korea) (28 May-2 June 2006)] AIP Conference Proceedings - Dislocation Elimination in Czochralski Silicon Crystal Growth Revealed by White X-ray Topography Combined with Topo-tomographic Technique
- 作者Kawado, Seiji; Iida, Satoshi; Kajiwara, Kentaro; Suzuki, Yoshifumi; Chikaura, Yoshinori
- 卷第879卷
- 文件大小829.24KB
- 发表时间2007
- DOI10.1063/1.2436359
- 页码1545-1549
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