SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Optical Design and Testing III - The effect of beam incident angles on cube corner retro-reflector measuring accuracy
- 作者Ouyang, Jianfei; Liu, Wanli; Qu, Xinghua; Yan, Yonggang; Wang, Yongtian; Tschudi, Theo T.; Rolland, Jannick P.; Tatsuno, Kimio
- 卷第6834卷
- 印刷ISSN0277-786X
- 文件大小340.02KB
- 发表时间2007
- DOI10.1117/12.756069
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