Adhesion of Crystalline GeSbTe/TiN Interface Characterized by Four Point Bend, Nanoindentation, and Nanoscratch
- 期刊名称MRS Proceedings
- 作者Wei, guohua; Liu, Jun; Fillmore, David; Violette, Mike; Lu, Shifeng
- 卷第997卷
- 电子ISSN1946-4274
- 文件大小259.05KB
- 发表时间2007-1
- DOI10.1557/proc-0997-i10-09