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[ECS 211th ECS Meeting - Chicago, Illinois (May 6-May 10, 2007)] ECS Transactions - Electrical Characterization of Advanced Gate Dielectrics

[ECS 211th ECS Meeting - Chicago, Illinois (May 6-May 10, 2007)] ECS Transactions - Electrical Characterization of Advanced Gate Dielectrics

Ma, T.P.

作者Ma, T.P.
卷第6卷
文件大小335.07KB
发表时间2007
DOI10.1149/1.2728826
页码655-669

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