SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Colony image acquisition and segmentation
Wang, W. X.; Yang, Li; Chen, Yaolong; Kley, Ernst-Bernhard; Li, Rongbin
- 作者Wang, W. X.; Yang, Li; Chen, Yaolong; Kley, Ernst-Bernhard; Li, Rongbin
- 卷第6722卷
- 印刷ISSN0277-786X
- 文件大小392.32KB
- 发表时间2007
- DOI10.1117/12.783646