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Switched-current circuits test using pseudo-random method

Switched-current circuits test using pseudo-random method

Guo Jierong; He Yigang; Tang Shengxue; Li Hongmin; Liu Meirong; Liu Hui

作者Guo Jierong; He Yigang; Tang Shengxue; Li Hongmin; Liu Meirong; Liu Hui
卷第52卷
印刷ISSN0925-1030
电子ISSN1573-1979
文件大小608.29KB
发表时间2007-08
DOI10.1007/s10470-007-9098-9
页码47-55

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