Influence of microgravity on Ce-doped Bi12SiO20crystal defect
Y. F. Zhou; J. Y. Xu; Y. Liu; L. D. Chen; Y. Y. Huang; W. X. Huang
- 作者Y. F. Zhou; J. Y. Xu; Y. Liu; L. D. Chen; Y. Y. Huang; W. X. Huang
- 卷第30卷
- 期第3期
- 印刷ISSN0250-4707
- 电子ISSN0973-7669
- 文件大小2284.21KB
- 发表时间2007-06
- DOI10.1007/s12034-007-0037-2
- 页码211-214