Effects of hydrogen content in sputtering ambient on ZnO:Al electrical properties
Joel N. Duenow; Timothy A. Gessert; David M. Wood; David L. Young; Timothy J. Coutts
- 作者Joel N. Duenow; Timothy A. Gessert; David M. Wood; David L. Young; Timothy J. Coutts
- 卷第354卷
- 印刷ISSN0022-3093
- 文件大小156.90KB
- 发表时间2008
- DOI10.1016/j.jnoncrysol.2007.10.070