![[IEEE Telecommunication Technology" (CriMiCo 2008) - Sevastopol, Ukraine (2008.09.8-2008.09.12)] 2008 18th International Crimean Conference - Microwave & Telecommunication Technology - Evaluation of the Schottky barrier parameters in the micron-size metal-semiconductor contacts]()
[IEEE Telecommunication Technology" (CriMiCo 2008) - Sevastopol, Ukraine (2008.09.8-2008.09.12)] 2008 18th International Crimean Conference - Microwave & Telecommunication Technology - Evaluation of the Schottky barrier parameters in the micron-size metal-semiconductor contactsAverin, S. V.; Lyubchenko, V. E. · 2008