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[IEEE 2008 16th IEEE International Conference on Networks - New Delhi, India (2008.12.12-2008.12.14)] 2008 16th IEEE International Conference on Networks - Reliability analysis of Wireless Sensor Network

[IEEE 2008 16th IEEE International Conference on Networks - New Delhi, India (2008.12.12-2008.12.14)] 2008 16th IEEE International Conference on Networks - Reliability analysis of Wireless Sensor Network

Purohit, Neetesh; Varadwaj, Pritish; Tokekar, Sanjiv

作者Purohit, Neetesh; Varadwaj, Pritish; Tokekar, Sanjiv
文件大小560.50KB
发表时间2008
DOI10.1109/ICON.2008.4772586
页码1-6

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