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SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 10 August 2008)] Nanostructured Thin Films - Analysis of silver columnar thin films by atomic force microscopy

SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 10 August 2008)] Nanostructured Thin Films - Analysis of silver columnar thin films by atomic force microscopy

Benkabou, Fatima; Smith, Geoffrey B.; Lakhtakia, Akhlesh; Lakhtakia, Akhlesh
  • 作者Benkabou, Fatima; Smith, Geoffrey B.; Lakhtakia, Akhlesh; Lakhtakia, Akhlesh
  • 卷第7041卷
  • 印刷ISSN0277-786X
  • 文件大小475.67KB
  • 发表时间2008
  • DOI10.1117/12.796212
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