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Does the three site Higgsless model survive the electroweak precision tests at loop?

Does the three site Higgsless model survive the electroweak precision tests at loop?

Abe, Tomohiro; Matsuzaki, Shinya; Tanabashi, Masaharu
  • 期刊名称Physical Review D
  • 作者Abe, Tomohiro; Matsuzaki, Shinya; Tanabashi, Masaharu
  • 卷第78卷
  • 期第5期
  • 印刷ISSN1550-7998
  • 电子ISSN1550-2368
  • 文件大小362.46KB
  • 发表时间2008-9-26
  • DOI10.1103/physrevd.78.055020
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