EDITOR'S ACKNOWLEDGMENTS
- 期刊名称International Journal of Testing
- 作者Hattie, John A.
- 卷第8卷
- 期第4期
- 印刷ISSN1530-5058
- 电子ISSN1532-7574
- 文件大小45.21KB
- 发表时间2008-11-13
- DOI10.1080/15305050802555271
- 页码409-410
[IEEE 2018 19th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA (2018.3.13-2018.3.14)] 2018 19th International Symposium on Quality Electronic Design (ISQED) - [Spine art]2018
[IEEE 2018 19th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA (2018.3.13-2018.3.14)] 2018 19th International Symposium on Quality Electronic Design (ISQED) - [Title page]2018
[IEEE 2018 19th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2018.3.13-2018.3.14)] 2018 19th International Symposium on Quality Electronic Design (ISQED) - Front cover2018
[IEEE 2018 19th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2018.3.13-2018.3.14)] 2018 19th International Symposium on Quality Electronic Design (ISQED) - Back cover2018
[IEEE 2018 19th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2018.3.13-2018.3.14)] 2018 19th International Symposium on Quality Electronic Design (ISQED) - Copyright page2018
[IEEE 2018 19th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2018.3.13-2018.3.14)] 2018 19th International Symposium on Quality Electronic Design (ISQED) - General information2018
[IEEE 2018 19th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2018.3.13-2018.3.14)] 2018 19th International Symposium on Quality Electronic Design (ISQED) - ISQED 2018 organizing committee2018
[IEEE 2018 19th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2018.3.13-2018.3.14)] 2018 19th International Symposium on Quality Electronic Design (ISQED) - Table of contents2018