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[IEEE 2008 IEEE Custom Integrated Circuits Conference - CICC 2008 - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference - Mismatch analysis and statistical design at 65 nm and below

[IEEE 2008 IEEE Custom Integrated Circuits Conference - CICC 2008 - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference - Mismatch analysis and statistical design at 65 nm and below

Pileggi, Larry; Keskin, Gokce; Li, Xin; Ken Mai, ; Proesel, Jon

作者Pileggi, Larry; Keskin, Gokce; Li, Xin; Ken Mai, ; Proesel, Jon
文件大小289.03KB
发表时间2008
DOI10.1109/cicc.2008.4672006
页码9-12

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