[IEEE 2008 IEEE International Symposium on Software Reliability Engineering (ISSRE) - Seattle, WA, USA (2008.11.10-2008.11.14)] 2008 19th International Symposium on Software Reliability Engineering (ISSRE) - Testing Software Product Lines Using Incremental Test Generation
Uzuncaova, Engin; Garcia, Daniel; Khurshid, Sarfraz; Batory, Don
- 作者Uzuncaova, Engin; Garcia, Daniel; Khurshid, Sarfraz; Batory, Don
- 文件大小246.92KB
- 发表时间2008
- DOI10.1109/issre.2008.56
- 页码249-258