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[IEEE 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Opio, France (2008.05.18-2008.05.22)] 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Reliability Characteristics of TANOS (TaN/AlO/SiN/Oxide/Si)NAND Flash Memory with Rounded Corner (RC) Structure

[IEEE 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Opio, France (2008.05.18-2008.05.22)] 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Reliability Characteristics of TANOS (TaN/AlO/SiN/Oxide/Si)NAND Flash Memory with Rounded Corner (RC) Structure

Chang, Sung-Il; Lee, Chang-Hyun; Kang, Changseok; Jeon, Sanghun; Kim, Juhyung; Choi, Byeong-In; Park, Youngwoo; Park, Jintaek; Jeong, Wonseok; You, Janghyun; Choi, Bonghyun; Sel, Jongsun; Sim, Jae Sung; Shin, Yoocheol; Choi, Jungdal; Lee, Won-Seong
  • 作者Chang, Sung-Il; Lee, Chang-Hyun; Kang, Changseok; Jeon, Sanghun; Kim, Juhyung; Choi, Byeong-In; Park, Youngwoo; Park, Jintaek; Jeong, Wonseok; You, Janghyun; Choi, Bonghyun; Sel, Jongsun; Sim, Jae Sung; Shin, Yoocheol; Choi, Jungdal; Lee, Won-Seong
  • 文件大小461.58KB
  • 发表时间2008
  • DOI10.1109/nvsmw.2008.40
  • 页码117-118
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