Surface assisted laser desorption–ionization mass spectrometry on patterned nanoporous silica thin films

• 作者A.M. Dattelbaum; R.K. Hicks; J. Shelley; A.T. Koppisch; S. Iyer
• 卷第114卷
• 印刷ISSN1387-1811
• 文件大小616.82KB
• 发表时间2008
• DOI10.1016/j.micromeso.2008.01.004
• 页码193-200