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Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter

Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter

Adam P. Hitchcock; James J. Dynes; Göran Johansson; Jian Wang; Gianluigi Botton
  • 作者Adam P. Hitchcock; James J. Dynes; Göran Johansson; Jian Wang; Gianluigi Botton
  • 卷第39卷
  • 期第6期
  • 印刷ISSN0968-4328
  • 文件大小1737.05KB
  • 发表时间2008
  • DOI10.1016/j.micron.2007.09.010
  • 页码741-748
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