Modeling of FEEP Plume Effects on MICROSCOPE Spacecraft
Roussel, Jean-FranÇois; Tondu, Thomas; Mateo-Velez, Jean-Charles; Chesta, Enrico; D'Escrivan, StÉphane; Perraud, Laurent
- 期刊名称IEEE Transactions on Plasma Science
- 作者Roussel, Jean-FranÇois; Tondu, Thomas; Mateo-Velez, Jean-Charles; Chesta, Enrico; D'Escrivan, StÉphane; Perraud, Laurent
- 卷第36卷
- 期第5期
- 印刷ISSN0093-3813
- 文件大小1461.55KB
- 发表时间2008-10
- DOI10.1109/tps.2008.2002541
- 页码2378-2386