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[IEEE 2008 10th IEEE International Workshop on Advanced Motion Control (AMC) - Trento, Italy (2008.03.26-2008.03.28)] 2008 10th IEEE International Workshop on Advanced Motion Control - Acquisition and visualization of personal characteristics by haptograph

[IEEE 2008 10th IEEE International Workshop on Advanced Motion Control (AMC) - Trento, Italy (2008.03.26-2008.03.28)] 2008 10th IEEE International Workshop on Advanced Motion Control - Acquisition and visualization of personal characteristics by haptograph

Seiichiro Katsura, ; Yuki Yokokura, ; Kiyoshi Ohishi,

作者Seiichiro Katsura, ; Yuki Yokokura, ; Kiyoshi Ohishi,
文件大小740.74KB
发表时间2008
DOI10.1109/amc.2008.4516106
页码434-439

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