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[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Memory-aware NoC Exploration and Design

[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Memory-aware NoC Exploration and Design

Dutt, Nikil

作者Dutt, Nikil
文件大小305.89KB
发表时间2008
DOI10.1109/date.2008.4484829
页码1128-1129

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