[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - Power Management for Wafer-Level Test During Burn-In
- 作者Bahukudumbi, Sudarshan; Chakrabarty, Krishnendu
- 文件大小286.88KB
- 发表时间2008
- DOI10.1109/ats.2008.26
- 页码231-236
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