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[IEEE 2008 International Conference on Condition Monitoring and Diagnosis - Beijing, China (2008.04.21-2008.04.24)] 2008 International Conference on Condition Monitoring and Diagnosis - The effect of atmospheric factor on various test gaps under negative impulse voltages

[IEEE 2008 International Conference on Condition Monitoring and Diagnosis - Beijing, China (2008.04.21-2008.04.24)] 2008 International Conference on Condition Monitoring and Diagnosis - The effect of atmospheric factor on various test gaps under negative impulse voltages

Chotigo, S.; Pungsiri, B.; Kanchana, S.

作者Chotigo, S.; Pungsiri, B.; Kanchana, S.
文件大小239.51KB
发表时间2008
DOI10.1109/cmd.2008.4580374
页码667-670

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