发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs

[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs

Bahukudumbi, Sudarshan; Chakrabarty, Krishnendu; Kacprowicz, Richard

作者Bahukudumbi, Sudarshan; Chakrabarty, Krishnendu; Kacprowicz, Richard
文件大小490.63KB
发表时间2008
DOI10.1109/date.2008.4484925
页码1103-1106

← 返回【学霸图书馆】主页