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[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Quantitative Productivity Measurement in IC Design

[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Quantitative Productivity Measurement in IC Design

Badstubner, Frank; Vorg, Andreas
  • 作者Badstubner, Frank; Vorg, Andreas
  • 文件大小69.59KB
  • 发表时间2008
  • DOI10.1109/date.2008.4484794
  • 页码934-935
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