[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - A Basis for Formal Robustness Checking
- 作者Fey, Goerschwin; Drechsler, Rolf
- 文件大小238.02KB
- 发表时间2008
- DOI10.1109/isqed.2008.4479838
- 页码784-789
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