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Equilibrium critical thickness for misfit dislocations in III-nitrides

Holec, David; Zhang, Yucheng; Rao, D. V. Sridhara; Kappers, Menno J.; McAleese, Clifford; Humphreys, Colin J.

期刊名称Journal of Applied Physics
作者Holec, David; Zhang, Yucheng; Rao, D. V. Sridhara; Kappers, Menno J.; McAleese, Clifford; Humphreys, Colin J.
卷第104卷
期第12期
印刷ISSN0021-8979
文件大小689.10KB
发表时间2008
DOI10.1063/1.3033553