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Planning accelerated life tests under Exponentiated‐Weibull‐Arrhenius model

Planning accelerated life tests under Exponentiated‐Weibull‐Arrhenius model

Barriga, Gladys D.C.; Lee Ho, Linda; Cancho, Vicente G.
  • 期刊名称International Journal of Quality & Reliability Management
  • 作者Barriga, Gladys D.C.; Lee Ho, Linda; Cancho, Vicente G.
  • 卷第25卷
  • 期第6期
  • 印刷ISSN0265-671X
  • 文件大小294.79KB
  • 发表时间2008-06-27
  • DOI10.1108/02656710810881926
  • 页码636-653
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