Planning accelerated life tests under Exponentiated‐Weibull‐Arrhenius model
Barriga, Gladys D.C.; Lee Ho, Linda; Cancho, Vicente G.
- 期刊名称International Journal of Quality & Reliability Management
- 作者Barriga, Gladys D.C.; Lee Ho, Linda; Cancho, Vicente G.
- 卷第25卷
- 期第6期
- 印刷ISSN0265-671X
- 文件大小294.79KB
- 发表时间2008-06-27
- DOI10.1108/02656710810881926
- 页码636-653