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[Lecture Notes in Computer Science] Computer Safety, Reliability, and Security Volume 5219 || The Effectiveness of T-Way Test Data Generation

[Lecture Notes in Computer Science] Computer Safety, Reliability, and Security Volume 5219 || The Effectiveness of T-Way Test Data Generation

Harrison, Michael D.; Sujan, Mark-Alexander
  • 作者Harrison, Michael D.; Sujan, Mark-Alexander
  • 文件大小238.54KB
  • 发表时间2008
  • DOI10.1007/978-3-540-87698-4_5
  • 页码16-29
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