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Taylor expansions of band-bending in MOS capacitance: application to scanning capacitance microscopy

Taylor expansions of band-bending in MOS capacitance: application to scanning capacitance microscopy

H. Murray; P. Martin; S. Bardy; F. Murray

作者H. Murray; P. Martin; S. Bardy; F. Murray
文件大小504.08KB
发表时间2008
DOI10.1088/0268-1242/23/3/035016

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