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[IEEE 2008 IEEE Custom Integrated Circuits Conference - CICC 2008 - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference - Session 2 - Statistical modeling

[IEEE 2008 IEEE Custom Integrated Circuits Conference - CICC 2008 - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference - Session 2 - Statistical modeling

Hidetoshi Onodera, ; Hong-Ha Vuong,

作者Hidetoshi Onodera, ; Hong-Ha Vuong,
文件大小116.61KB
发表时间2008
DOI10.1109/cicc.2008.4672004

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