Electrical characterization of defects introduced in Ge during electron beam deposition of different metals

• 作者F. D. Auret; S. M. M. Coelho; M. Hayes; W. E. Meyer; J. M. Nel
• 卷第205卷
• 期第1期
• 印刷ISSN1862-6319
• 文件大小108.05KB
• 发表时间2008
• DOI10.1002/pssa.200776814
• 页码159-161