A Proactive Wearout Recovery Approach for Exploiting Microarchitectural Redundancy to Extend Cache SRAM Lifetime
- 期刊名称ACM SIGARCH Computer Architecture News
- 作者Shin, Jeonghee; Zyuban, Victor; Bose, Pradip; Pinkston, Timothy M.
- 卷第36卷
- 期第3期
- 印刷ISSN0163-5964
- 文件大小290.17KB
- 发表时间2008-06-01
- DOI10.1145/1394608.1382151
- 页码353-362
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