A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET
- 作者Gang Zhang; Won Jong Yoo; Chung Ho Ling
- 卷第52卷
- 期第11期
- 印刷ISSN0038-1101
- 文件大小242.70KB
- 发表时间2008
- DOI10.1016/j.sse.2008.07.007
- 页码1773-1777
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