Structural characterization and iron detection at Σ3 grain boundaries in multicrystalline silicon
Chen, Bin; Chen, Jun; Sekiguchi, Takashi; Saito, Mitsuhiro; Kimoto, Koji
- 作者Chen, Bin; Chen, Jun; Sekiguchi, Takashi; Saito, Mitsuhiro; Kimoto, Koji
- 卷第105卷
- 期第11期
- 印刷ISSN0021-8979
- 文件大小812.31KB
- 发表时间2009
- DOI10.1063/1.3129583