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[IEEE NAECON 2009 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2009.07.21-2009.07.23)] Proceedings of the IEEE 2009 National Aerospace & Electronics Conference (NAECON) - Stimulus generator for SEIR method based ADC BIST

[IEEE NAECON 2009 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2009.07.21-2009.07.23)] Proceedings of the IEEE 2009 National Aerospace & Electronics Conference (NAECON) - Stimulus generator for SEIR method based ADC BIST

Duan, Jingbo; Vasan, Bharath; Zhao, Chen; Chen, Degang; Geiger, Randall

作者Duan, Jingbo; Vasan, Bharath; Zhao, Chen; Chen, Degang; Geiger, Randall
文件大小995.43KB
发表时间2009
DOI10.1109/naecon.2009.5426617
页码251-255

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