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[IEEE 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC 2009) - Xi'an (2009.12.25-2009.12.27)] 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Digital static calibration technology used for 400MSPS, 16-bit DAC

[IEEE 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC 2009) - Xi'an (2009.12.25-2009.12.27)] 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Digital static calibration technology used for 400MSPS, 16-bit DAC

Zhu Dongmei, ; Fu Dongbing, ; Shi Jiangang, ; Li Kaicheng,

作者Zhu Dongmei, ; Fu Dongbing, ; Shi Jiangang, ; Li Kaicheng,
文件大小4941.58KB
发表时间2009
DOI10.1109/EDSSC.2009.5394183
页码91-94

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