Physics process level discrimination of detections for GATE: Assessment of contamination in SPECT and spurious activity in PET
De Beenhouwer, Jan; Staelens, Steven; Vandenberghe, Stefaan; Verhaeghe, Jeroen; Van Holen, Roel; Rault, Erwann; Lemahieu, Ignace
- 期刊名称Medical Physics
- 作者De Beenhouwer, Jan; Staelens, Steven; Vandenberghe, Stefaan; Verhaeghe, Jeroen; Van Holen, Roel; Rault, Erwann; Lemahieu, Ignace
- 卷第36卷
- 期第4期
- 印刷ISSN0094-2405
- 文件大小350.02KB
- 发表时间2009
- DOI10.1118/1.3078045