SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Manufacturing and Testing VIII - Limits for interferometer calibration using the random ball test
- 作者Zhou, Ping; Burge, James H.; Fähnle, Oliver W.; Burge, James H.; Williamson, Ray
- 卷第7426卷
- 印刷ISSN0277-786X
- 文件大小922.89KB
- 发表时间2009
- DOI10.1117/12.828503