[IEEE 2009 17th IEEE International Requirements Engineering Conference (RE) - Atlanta, Georgia, USA (2009.08.31-2009.09.4)] 2009 17th IEEE International Requirements Engineering Conference - Looking for Product Line Feature Models Defects: Towards a Systematic Classification of Verification Criteria
- 作者Salinesi, Camille; Rolland, Colette; Diaz, Daniel; Mazo, Raúl
- 文件大小183.68KB
- 发表时间2009
- DOI10.1109/re.2009.57
- 页码385-386
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