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[IEEE 2009 10th International Conference on Document Analysis and Recognition - Barcelona, Spain (2009.07.26-2009.07.29)] 2009 10th International Conference on Document Analysis and Recognition - Global Features for the Off-Line Signature Verification Problem

[IEEE 2009 10th International Conference on Document Analysis and Recognition - Barcelona, Spain (2009.07.26-2009.07.29)] 2009 10th International Conference on Document Analysis and Recognition - Global Features for the Off-Line Signature Verification Problem

Nguyen, Vu; Blumenstein, Michael; Leedham, Graham

作者Nguyen, Vu; Blumenstein, Michael; Leedham, Graham
文件大小789.17KB
发表时间2009
DOI10.1109/icdar.2009.123
页码1300-1304

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