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[IEEE 2009 Eighth IEEE/ACIS International Conference on Computer and Information Science - Shanghai, China (2009.06.1-2009.06.3)] 2009 Eighth IEEE/ACIS International Conference on Computer and Information Science - Research on Test Suite Reduction Using Attribute Relevance Analysis

[IEEE 2009 Eighth IEEE/ACIS International Conference on Computer and Information Science - Shanghai, China (2009.06.1-2009.06.3)] 2009 Eighth IEEE/ACIS International Conference on Computer and Information Science - Research on Test Suite Reduction Using Attribute Relevance Analysis

Zeng, Fanping; Li, Ling; Li, Juan; Wang, Xufa

作者Zeng, Fanping; Li, Ling; Li, Juan; Wang, Xufa
文件大小420.14KB
发表时间2009
DOI10.1109/ICIS.2009.139
页码961-966

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