[IEEE 2009 Annual Reliability and Maintainability Symposium (RAMS) - Fort Worth, TX, USA (2009.01.26-2009.01.29)] 2009 Annual Reliability and Maintainability Symposium - Software reliability modeling of fault detection and correction processes
Yanjun Shu, ; Zhibo Wu, ; Liu, Hongwei; Yang, Xiaozong
- 作者Yanjun Shu, ; Zhibo Wu, ; Liu, Hongwei; Yang, Xiaozong
- 文件大小402.66KB
- 发表时间2009
- DOI10.1109/rams.2009.4914730
- 页码521-526