![[ACM Press the Second ACM-IEEE international symposium - Kaiserslautern, Germany (2008.10.09-2008.10.10)] Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement - ESEM '08 - Defect categorization]()
[ACM Press the Second ACM-IEEE international symposium - Kaiserslautern, Germany (2008.10.09-2008.10.10)] Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement - ESEM '08 - Defect categorizationSeaman, Carolyn B.; Shull, Forrest; Regardie, Myrna; Elbert, Denis; Feldmann, Raimund L.; Guo, Yuepu; Godfrey, Sally · 2008