[IEEE 2009 Conference on Innovative Technologies in Intelligent Systems and Industrial Applications (CITISIA) - Kuala Lumpur, Malaysia (2009.07.25-2009.07.26)] 2009 Innovative Technologies in Intelligent Systems and Industrial Applications - Detection of bond cratering defects under aluminum wedge bond using I–V characteristics and liquid crystal thermography
- 作者Lau, C. K.; Sim, K. S.; Tso, C. P.; Ting, H. Y.
- 文件大小2398.50KB
- 发表时间2009
- DOI10.1109/citisia.2009.5224221
- 页码154-158
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