[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Soft Core Embedded Processor Based Built-In Self-Test of FPGAs
- 作者Dutton, Bradley F.; Stroud, Charles E.
- 文件大小354.07KB
- 发表时间2009
- DOI10.1109/dft.2009.51
- 页码29-37
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