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[IEEE 2009 IEEE International Conference on Computer Design (ICCD 2009) - Lake Tahoe, CA, USA (2009.10.4-2009.10.7)] 2009 IEEE International Conference on Computer Design - Reliable cache design with detection of gate oxide breakdown using BIST

[IEEE 2009 IEEE International Conference on Computer Design (ICCD 2009) - Lake Tahoe, CA, USA (2009.10.4-2009.10.7)] 2009 IEEE International Conference on Computer Design - Reliable cache design with detection of gate oxide breakdown using BIST

Ahmed, Fahad; Milor, Linda

作者Ahmed, Fahad; Milor, Linda
文件大小534.62KB
发表时间2009
DOI10.1109/iccd.2009.5413131
页码366-371

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