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Contact resistance in carbon nanostructure via interconnects

Wu, Wen; Krishnan, Shoba; Yamada, Toshishige; Sun, Xuhui; Wilhite, Patrick; Wu, Raymond; Li, Ke; Yang, Cary Y.

期刊名称Applied Physics Letters
作者Wu, Wen; Krishnan, Shoba; Yamada, Toshishige; Sun, Xuhui; Wilhite, Patrick; Wu, Raymond; Li, Ke; Yang, Cary Y.
卷第94卷
期第16期
印刷ISSN0003-6951
文件大小429.20KB
发表时间2009
DOI10.1063/1.3123164