[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - The Research and Application of Random Sampling in Digital Storage Oscilloscope
Zhao, Yijiu; Zhuang, Xiaoyan; Wang, Li
- 作者Zhao, Yijiu; Zhuang, Xiaoyan; Wang, Li
- 文件大小356.56KB
- 发表时间2009
- DOI10.1109/cas-ictd.2009.4960896
- 页码1-3