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[IEEE 2009 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2009) - Orlando, FL (2009.10.24-2009.11.1)] 2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC) - Influence of secondary particles from heavy ion irradiation to in-beam OpenPET detectors

[IEEE 2009 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2009) - Orlando, FL (2009.10.24-2009.11.1)] 2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC) - Influence of secondary particles from heavy ion irradiation to in-beam OpenPET detectors

Nishikido, F.; Yazaki, Y.; Osada, H.; Inadama, N.; Inaniwa, T.; Satoh, S.; Shibuya, K.; Yoshida, E.; Yamaya, T.; Murayama, H.
  • 作者Nishikido, F.; Yazaki, Y.; Osada, H.; Inadama, N.; Inaniwa, T.; Satoh, S.; Shibuya, K.; Yoshida, E.; Yamaya, T.; Murayama, H.
  • 文件大小370.69KB
  • 发表时间2009
  • DOI10.1109/nssmic.2009.5402170
  • 页码2404-2406
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